Title :
Sat-based speedpath debugging using waveforms
Author :
Dehbashi, M. ; Fey, Gorschwin
Author_Institution :
Inst. of Comput. Sci., Univ. of Bremen, Bremen, Germany
Abstract :
A major concern in the design of high performance VLSI circuits is speedpath debugging. This is due to the fact that timing variations induced by process variations and environmental effects are increasing as the size of VLSI circuits is shrinking. In this paper, a speedpath debugging approach based on Boolean Satisfiability (SAT) is proposed. The approach takes waveforms of the signals of a circuit into account. Waveforms and their propagation are encoded using SAT. Also, timing variation models for slowdown and speedup of each gate are incorporated into the model. The whole timing variation is controlled by a unit called variation control. Having an Erroneous Trace (ET) due to timing variation, our debug engine automatically finds potential failing speedpaths. The experimental results on ISCAS benchmarks show efficiency and diagnosis accuracy of our approach. The approach can also localize potential failing speedpaths for the multiplier circuit c6288 that has a large number of paths.
Keywords :
Boolean algebra; VLSI; computability; fault diagnosis; logic testing; multiplying circuits; waveform analysis; Boolean SAT; Boolean satisfiability; ISCAS benchmarks; SAT-based speedpath debugging; environmental effects; erroneous trace; high performance VLSI circuits; multiplier circuit c6288; process variations; timing variation models; variation control; waveforms; Circuit faults; Clocks; Debugging; Delays; Integrated circuit modeling; Logic gates; automated debugging; speedpaths; timing variation; waveforms;
Conference_Titel :
Test Symposium (ETS), 2014 19th IEEE European
Conference_Location :
Paderborn
DOI :
10.1109/ETS.2014.6847802