DocumentCode :
170137
Title :
Site dependencies in a multisite testing environment
Author :
Lehner, Thomas ; Kuhr, Andreas ; Wahl, Michael ; Bruck, Roman
Author_Institution :
Test Dept., ELMOS Semicond. AG, Dortmund, Germany
fYear :
2014
fDate :
26-30 May 2014
Firstpage :
1
Lastpage :
6
Abstract :
This paper describes a statistical approach for online yield analysis for multisite testing of highly reliable automotive ICs as well as the implementation of the system for testing mostly analog circuits. The core of the approach is the yield analysis of the different sites based on statistical measures. The system has been implemented as part of the production environment of Elmos Semiconductor. It is in daily use. Although the analysis tool has been accepted reluctantly, it soon became an excellent tool with a significant impact on test quality and cost saving.
Keywords :
analogue integrated circuits; integrated circuit testing; integrated circuit yield; analog circuits testing; automotive IC; cost saving; multisite testing environment; online yield analysis; site dependencies; test quality; Current measurement; Hardware; Maintenance engineering; Production; Standards; Statistical analysis; Testing; Multisite Testing; Test; analog testing; statistics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium (ETS), 2014 19th IEEE European
Conference_Location :
Paderborn
Type :
conf
DOI :
10.1109/ETS.2014.6847808
Filename :
6847808
Link To Document :
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