Title :
Modeling of passive elements and reliability
Author :
Gildenblat, Gennady ; Onodera, Hidetoshi
Author_Institution :
Arizona State University, USA
Abstract :
Rapid growth of RF CMOS applications makes it necessary to develop accurate models of passive circuit elements such as inductors and resistors. Given the complexity of the integrated circuit passive elements and the increased demands for the compact models accuracy, development of the compact models of inductors and resistors becomes an interesting and challenging research area. The reliability modeling has remained an important task since the days of the first integrated circuits. Continued scaling of the state of the art integrated circuit technology accompanied by the reduced margins for error demands the increasing accuracy of the reliability modeling.
Keywords :
CMOS process; Circuit testing; Circuit topology; Delay; Frequency measurement; Inverters; MOS devices; Ring oscillators; Spatial resolution; Tiles;
Conference_Titel :
Custom Integrated Circuits Conference, 2009. CICC '09. IEEE
Conference_Location :
San Jose, CA, USA
Print_ISBN :
978-1-4244-4071-9
Electronic_ISBN :
978-1-4244-4073-3
DOI :
10.1109/CICC.2009.5280810