DocumentCode
170155
Title
INL systematic reduced-test technique for Pipeline ADCs
Author
Peralias, E. ; Gines, Antonio ; Rueda, Andrea
Author_Institution
Inst. de Microelectron. de Sevilla (CNM-CSIC), Univ. de Sevilla (USE), Sevilla, Spain
fYear
2014
fDate
26-30 May 2014
Firstpage
1
Lastpage
6
Abstract
This paper presents a procedure to implement a high efficient test of the Integral Non-linearity (INL) of Pipeline ADCs using an extremely reduced set of test input amplitude levels (one order of magnitude lower than the total number of codes in the ADC). For a given architecture, the method provides the way to determine these levels to robustly capture the nonlinearity information. The location of each test level within the input range has low sensitivity to the internal ADC noise, and therefore, they are a good basis to continuously monitor the impact of process, aging and environment conditions variations (PVT) on the non-linearity, as well as miscalibration and possible failures in both foreground and background applications. The proposed method has been validated by realistic behavioral models in several examples.
Keywords
analogue-digital conversion; integrated circuit testing; INL systematic reduced test technique; pipeline ADC; test input amplitude levels; Linearity; Noise; Pipelines; Redundancy; Robustness; Systematics; Testing; INL test; Linearity testing; Pipeline ADC test; Reduced test; Test time reduction;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ETS), 2014 19th IEEE European
Conference_Location
Paderborn
Type
conf
DOI
10.1109/ETS.2014.6847818
Filename
6847818
Link To Document