• DocumentCode
    170155
  • Title

    INL systematic reduced-test technique for Pipeline ADCs

  • Author

    Peralias, E. ; Gines, Antonio ; Rueda, Andrea

  • Author_Institution
    Inst. de Microelectron. de Sevilla (CNM-CSIC), Univ. de Sevilla (USE), Sevilla, Spain
  • fYear
    2014
  • fDate
    26-30 May 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper presents a procedure to implement a high efficient test of the Integral Non-linearity (INL) of Pipeline ADCs using an extremely reduced set of test input amplitude levels (one order of magnitude lower than the total number of codes in the ADC). For a given architecture, the method provides the way to determine these levels to robustly capture the nonlinearity information. The location of each test level within the input range has low sensitivity to the internal ADC noise, and therefore, they are a good basis to continuously monitor the impact of process, aging and environment conditions variations (PVT) on the non-linearity, as well as miscalibration and possible failures in both foreground and background applications. The proposed method has been validated by realistic behavioral models in several examples.
  • Keywords
    analogue-digital conversion; integrated circuit testing; INL systematic reduced test technique; pipeline ADC; test input amplitude levels; Linearity; Noise; Pipelines; Redundancy; Robustness; Systematics; Testing; INL test; Linearity testing; Pipeline ADC test; Reduced test; Test time reduction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ETS), 2014 19th IEEE European
  • Conference_Location
    Paderborn
  • Type

    conf

  • DOI
    10.1109/ETS.2014.6847818
  • Filename
    6847818