• DocumentCode
    1701602
  • Title

    Preliminary experiments for power supply noise reduction using stubs

  • Author

    Nakura, Tom ; Ikeda, Makoto ; Asada, Kunihiro

  • Author_Institution
    Dept. of Electron. Eng., Univ. of Tokyo, Japan
  • fYear
    2004
  • Firstpage
    286
  • Lastpage
    289
  • Abstract
    This paper demonstrates a power supply noise reduction using stubs. A quarter-length stub attached to the power supply line of an LSI chip works as a band-eliminate filter, and suppresses the power supply noise of the designed frequency. Preliminary experiments show that 90% of the designed frequency noise component is suppressed when off-chip stubs are attached to a power supply pin of a 1.15GHz operating LSI. The results show the possibility of the stub on-chip integration when the operating frequency of LSIs becomes higher and the stub length becomes shorter.
  • Keywords
    CMOS logic circuits; band-stop filters; combinational circuits; large scale integration; power supply circuits; random noise; LSI chip; band-eliminate filter; characteristic impedance; combination logic; frequency noise component; inverter chain; off-chip stubs; on-chip integration; power supply noise reduction; pseudo random bit stream generation circuit; quarter-length stub; standard CMOS technology; stub length; Capacitors; Circuit testing; Frequency; Impedance; Large scale integration; Noise generators; Noise reduction; Power supplies; Power transmission lines; Transmission line theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced System Integrated Circuits 2004. Proceedings of 2004 IEEE Asia-Pacific Conference on
  • Print_ISBN
    0-7803-8637-X
  • Type

    conf

  • DOI
    10.1109/APASIC.2004.1349473
  • Filename
    1349473