• DocumentCode
    1701672
  • Title

    Advanced low temperature bonding technologies

  • Author

    Pelzer, Rainer ; Dragoi, Viorel ; Kettner, Paul ; Lee, Dennis

  • Author_Institution
    EV Group, Schaerding, Austria
  • fYear
    2004
  • Abstract
    The different fields and especially its various applications for microelectromechanical systems (MEMS) prevent the use of uniform packaging techniques for all types of μ-device. Several bonding techniques performed at wafer-scale, with the advantage of protecting the device against particles, contaminations or even damage during the sawing and dicing process are used right now. Most of these techniques are performed at high temperatures during the bond, wet cleaning process steps - totally inapplicable for μ-moving parts - or insufficient hermeticity in the final package. Bonding techniques based on dry plasma activation and adhesive wafer-level bonding of MEMS are therefore a very interesting alternative to the common techniques. Main advantages of these two techniques are: temperature sensitive devices or heterogeneous materials with different CTE can be bonded together on wafer scale; there is no wet activation or cleaning processes involved.
  • Keywords
    electronics packaging; low-temperature techniques; micromechanical devices; plasma materials processing; sawing; wafer bonding; adhesive bonding; dicing process; dry plasma activation; heterogeneous materials; low temperature bonding; microelectromechanical systems; sawing process; temperature sensitive devices; uniform packaging techniques; wet cleaning process; Cleaning; Contamination; Microelectromechanical systems; Micromechanical devices; Packaging; Plasma temperature; Protection; Sawing; Wafer bonding; Wafer scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Electronics, 2004. ICSE 2004. IEEE International Conference on
  • Print_ISBN
    0-7803-8658-2
  • Type

    conf

  • DOI
    10.1109/SMELEC.2004.1620832
  • Filename
    1620832