DocumentCode
1701672
Title
Advanced low temperature bonding technologies
Author
Pelzer, Rainer ; Dragoi, Viorel ; Kettner, Paul ; Lee, Dennis
Author_Institution
EV Group, Schaerding, Austria
fYear
2004
Abstract
The different fields and especially its various applications for microelectromechanical systems (MEMS) prevent the use of uniform packaging techniques for all types of μ-device. Several bonding techniques performed at wafer-scale, with the advantage of protecting the device against particles, contaminations or even damage during the sawing and dicing process are used right now. Most of these techniques are performed at high temperatures during the bond, wet cleaning process steps - totally inapplicable for μ-moving parts - or insufficient hermeticity in the final package. Bonding techniques based on dry plasma activation and adhesive wafer-level bonding of MEMS are therefore a very interesting alternative to the common techniques. Main advantages of these two techniques are: temperature sensitive devices or heterogeneous materials with different CTE can be bonded together on wafer scale; there is no wet activation or cleaning processes involved.
Keywords
electronics packaging; low-temperature techniques; micromechanical devices; plasma materials processing; sawing; wafer bonding; adhesive bonding; dicing process; dry plasma activation; heterogeneous materials; low temperature bonding; microelectromechanical systems; sawing process; temperature sensitive devices; uniform packaging techniques; wet cleaning process; Cleaning; Contamination; Microelectromechanical systems; Micromechanical devices; Packaging; Plasma temperature; Protection; Sawing; Wafer bonding; Wafer scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Electronics, 2004. ICSE 2004. IEEE International Conference on
Print_ISBN
0-7803-8658-2
Type
conf
DOI
10.1109/SMELEC.2004.1620832
Filename
1620832
Link To Document