Title :
An off-line MDSI interconnect BIST incorporated in BS 1149.1
Author :
Mohammadi, M. ; Sadeghi-Kohan, Somayeh ; Masoumi, Nasser ; Navabi, Zainalabedin
Author_Institution :
Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran
Abstract :
This paper presents an off-line interconnect test methodology that implements the MDSI (Maximal Dominant Signal Integrity) crosstalk fault model. The test methodology consists of MDSI test pattern generators and response analyzers that are incorporated into the IEEE BS 1149.1 Standard on the two sides of an interconnect. This work is the first in implementing MDSI hardware structure. Our method is compared with hardware structures implementing MA interconnect tests.
Keywords :
built-in self test; crosstalk; integrated circuit interconnections; integrated circuit testing; IEEE BS 1149.1 standard; MA interconnection testing; MDSI hardware structure; MDSI test pattern generator; crosstalk fault model; maximal dominant signal integrity; offline MDSI interconnection BIST; offline interconnection test methodology; response analyzer; Circuit faults; Computer architecture; Crosstalk; Hardware; Integrated circuit interconnections; Standards; Testing; IEEE 1149.1; MDSI modeling; crosstalk fault;
Conference_Titel :
Test Symposium (ETS), 2014 19th IEEE European
Conference_Location :
Paderborn
DOI :
10.1109/ETS.2014.6847847
