• DocumentCode
    1702612
  • Title

    Intrinsic Capacitances Computation Of Semiconductor Multi Electrodes Devices

  • Author

    Mottet, S. ; Viallet, J.E.

  • Author_Institution
    Centre National d´´Etudes des Telecommunications
  • fYear
    1987
  • Firstpage
    289
  • Lastpage
    294
  • Abstract
    Steady state simulation of silicon and IU-IZ devices are performed by solving the general set of equation (eventually completed by energy conservation equation. Using finite difference (FD) or finite element methods (FEM), the resolution gives the device terminal currents with accuracy. But as the internal capacitances of the device are concerned, a general quasi-static method to determine the capacitances of multielectrode stuctures is desirable. Such a method should not call for any specific consideration over geometry or conduction behavior, so as to be included in a universal simulation code.
  • Keywords
    Capacitance measurement; Charge measurement; Conductors; Current measurement; Density measurement; Dielectrics; Difference equations; Electrodes; Schottky diodes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Numerical Analysis of Semiconductor Devices and Integrated Circuits, 1987. NASECODE V. Proceedings of the Fifth International Conference on the
  • Conference_Location
    Dublin, Ireland
  • Print_ISBN
    0-906783-72-0
  • Type

    conf

  • DOI
    10.1109/NASCOD.1987.721194
  • Filename
    721194