DocumentCode
1702612
Title
Intrinsic Capacitances Computation Of Semiconductor Multi Electrodes Devices
Author
Mottet, S. ; Viallet, J.E.
Author_Institution
Centre National d´´Etudes des Telecommunications
fYear
1987
Firstpage
289
Lastpage
294
Abstract
Steady state simulation of silicon and IU-IZ devices are performed by solving the general set of equation (eventually completed by energy conservation equation. Using finite difference (FD) or finite element methods (FEM), the resolution gives the device terminal currents with accuracy. But as the internal capacitances of the device are concerned, a general quasi-static method to determine the capacitances of multielectrode stuctures is desirable. Such a method should not call for any specific consideration over geometry or conduction behavior, so as to be included in a universal simulation code.
Keywords
Capacitance measurement; Charge measurement; Conductors; Current measurement; Density measurement; Dielectrics; Difference equations; Electrodes; Schottky diodes;
fLanguage
English
Publisher
ieee
Conference_Titel
Numerical Analysis of Semiconductor Devices and Integrated Circuits, 1987. NASECODE V. Proceedings of the Fifth International Conference on the
Conference_Location
Dublin, Ireland
Print_ISBN
0-906783-72-0
Type
conf
DOI
10.1109/NASCOD.1987.721194
Filename
721194
Link To Document