• DocumentCode
    1702911
  • Title

    GaAs Integrated Circuit Testing Using Electrooptic Sampling

  • Author

    Weingarten, K.J. ; Rodwell, M.J.W. ; Bloom, D.M.

  • Author_Institution
    Stanford University
  • fYear
    1987
  • Firstpage
    35
  • Lastpage
    44
  • Keywords
    Circuit testing; Digital integrated circuits; Frequency measurement; Gallium arsenide; Integrated circuit testing; Microwave integrated circuits; Optical polarization; Probes; Sampling methods; Transmission line measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Speed Semiconductor Devices and Circuits, 1987. Proceedings., IEEE/Cornell Conference on Advanced Concepts in
  • Type

    conf

  • DOI
    10.1109/CORNEL.1987.721211
  • Filename
    721211
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1702911