Title :
GaAs Integrated Circuit Testing Using Electrooptic Sampling
Author :
Weingarten, K.J. ; Rodwell, M.J.W. ; Bloom, D.M.
Author_Institution :
Stanford University
Keywords :
Circuit testing; Digital integrated circuits; Frequency measurement; Gallium arsenide; Integrated circuit testing; Microwave integrated circuits; Optical polarization; Probes; Sampling methods; Transmission line measurements;
Conference_Titel :
High Speed Semiconductor Devices and Circuits, 1987. Proceedings., IEEE/Cornell Conference on Advanced Concepts in
DOI :
10.1109/CORNEL.1987.721211
