• DocumentCode
    1703300
  • Title

    An 11mW 100MHz 16X-OSR 64dB-SNDR hybrid CT/DT ΔΣ ADC with relaxed DEM timing

  • Author

    Kwon, Sunwoo ; Hanumolu, Pavan Kumar ; Kim, Sang-Ho ; Lee, Sung-No ; You, Seung-Bin ; Park, Ho-Jin ; Kim, Jae-Whui ; Moon, Un-Ku

  • Author_Institution
    Dongbu HiTek, Seoul, South Korea
  • fYear
    2009
  • Firstpage
    171
  • Lastpage
    174
  • Abstract
    A multi-bit third-order hybrid DeltaSigma ADC is presented. The ADC obviates the need for dynamic element matching (DEM) in the critical feedback path, eliminating the systematic boundary of high clock frequency. This implementation incorporates continuous-time integrators in the first two stages to reduced power consumption, and a discrete-time integrator in the last stage to mitigate excess loop delay and quantizer sampling timing problem. The duty-cycle based Switched-R-MOSFET-C (SRMC) tuning employed in the design also helps to absorb finite opamp bandwidth/delay as well as frequency scalability. The proposed DeltaSigma ADC is capable of converting up to +2 dBFS input without pole optimization. The 65 nm CMOS implementation achieves 68 dB DR, 65 dB SNR, 64 dB SNDR, and 84 dB SFDR, while consuming 11 mW at 100 MHz clock and 16X OSR.
  • Keywords
    CMOS digital integrated circuits; circuit feedback; continuous time systems; delta-sigma modulation; discrete time systems; integrating circuits; operational amplifiers; CMOS implementation; clock frequency; continuous-time integrators; critical feedback path; discrete-time integrator; duty-cycle based switched-R-MOSFET-C tuning; dynamic element matching; finite opamp bandwidth; frequency 100 MHz; frequency scalability; multibit third-order hybrid DeltaSigma ADC; power 11 mW; relaxed DEM timing; size 65 nm; Bandwidth; Clocks; Delay; Energy consumption; Feedback; Frequency; Sampling methods; Scalability; Timing; Tuning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 2009. CICC '09. IEEE
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-4071-9
  • Electronic_ISBN
    978-1-4244-4073-3
  • Type

    conf

  • DOI
    10.1109/CICC.2009.5280871
  • Filename
    5280871