DocumentCode
1703319
Title
Performance Evaluation of the Probe Storage Channel
Author
Parnell, Thomas P. ; Pozidis, Haralampos ; Zaboronski, Oleg V.
Author_Institution
Warwick Univ. Digital Lab., Siglead Eur. Ltd., Coventry, UK
fYear
2009
Firstpage
1
Lastpage
6
Abstract
Scanning probes can be used for storage of data at ultra-high areal densities, beyond those achieved by other techniques. Thermo-mechanical probe storage is one variant of scanning-probe technology in which data is stored in the form of indentations in thin polymer films. A simplified channel model of thermo-mechanical probe storage is first introduced, derived from a comprehensive characterization study of experimentally extracted read-back signals. This model is then used as basis for deriving analytical expressions for the probability density function of the storage channel output signal in the presence of stochastic impairments such as noise and jitter. These expressions are used to construct an optimal bit-by-bit channel detector and to derive a theoretical formula for its bit error rate. Finally, the results of the analytical study are validated by comparison with simulation results. Analytical expressions for the channel output statistics are valuable as they enable quick performance comparisons between candidate detection schemes without resorting to lengthy simulations. Furthermore, they can be used to design probabilistic/soft detectors for soft-input error-correction schemes.
Keywords
data handling; probability; scanning probe microscopy; signal processing; data storage; optimal bit-by-bit channel detector; performance evaluation; probability density function; probe storage channel; read-back signal extraction; scanning probe technology; stochastic impairments; storage channel output signal; thermo-mechanical probe storage; Analytical models; Data mining; Detectors; Jitter; Polymer films; Probability density function; Probes; Signal analysis; Stochastic resonance; Thermomechanical processes;
fLanguage
English
Publisher
ieee
Conference_Titel
Global Telecommunications Conference, 2009. GLOBECOM 2009. IEEE
Conference_Location
Honolulu, HI
ISSN
1930-529X
Print_ISBN
978-1-4244-4148-8
Type
conf
DOI
10.1109/GLOCOM.2009.5426217
Filename
5426217
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