• DocumentCode
    1703419
  • Title

    The surface site dehydration mechanism for Si3N4 sensing membrane by post-baking treatment

  • Author

    Lai, Chao-Sung ; Yang, Chia-Ming ; Chih-Yao Wang ; Cheng-En Lue ; Lue, Cheng-En ; Ko, Hung-Pin ; Wang, Chih-Yao

  • Author_Institution
    Dept. of Electron. Eng., Chang Gung Univ., Tao-Yuan, Taiwan
  • fYear
    2004
  • Abstract
    This work presented a post-baking treatment effect on Si3N4 sensing membrane for the pH response. Special measurement sequences were proposed to verify the surface site activation and de-hydration. Sensitivity was improved by pH4 buffer solution immersion. However, sensitivities were decreased 3-8.5 mV/pH and 1-2.8mV/pH by first and second baking cycle respectively. Higher baking temperature made the sensitivity decrease more. It was due to ion and surface site exchange and repaired the dangling bond on sensing membrane during buffer immersion. The post-baking treatment broke some active sites by thermal energy. The higher baking temperature provided more thermal energy to break active sites and degrade more sensitivity. A novel physical model was proposed for the activation and dehydration behavior.
  • Keywords
    chemical sensors; heat treatment; ion exchange; pH measurement; sensitivity; silicon compounds; surface chemistry; Si3N4; buffer solution immersion; ion exchange; pH response; post-baking treatment effect; silicon nitride sensing membrane; surface site activation; surface site dehydration mechanism; surface site exchange; thermal energy; Biomembranes; Bonding; Capacitance-voltage characteristics; Chaos; Pressure measurement; Silicon; Surface treatment; Temperature sensors; Thermal degradation; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Electronics, 2004. ICSE 2004. IEEE International Conference on
  • Print_ISBN
    0-7803-8658-2
  • Type

    conf

  • DOI
    10.1109/SMELEC.2004.1620892
  • Filename
    1620892