• DocumentCode
    1703695
  • Title

    Cleanroom contamination monitoring using FTIR

  • Author

    Basri, Mohd Juhari bin Mat ; Yee, Wong Yuen ; Majlis, Burhanuddin Yeop

  • Author_Institution
    Inst. of Microeng. & Nanoelectron., Universiti Kebangsaan Malaysia, Selangor, Malaysia
  • fYear
    2004
  • Abstract
    Fourier transformed infrared spectroscopy (FTIR) was used to obtain spectrum of some consumable products used in the Institute of Microengineering and Nanoelectronics (IMEN) cleanroom at UKM. These spectra are used as reference FTIR databases. Random samples were extracted from that consumable products and tested using FTIR to get sample spectra. These sample spectra were then used as "fingerprints" to determine the identity of contaminants by matching the IR absorption spectrum with reference databases. All reference gave reproducible characteristic infrared absorption spectra. The samples showed close similarity of spectrum corresponding to the source of extraction. While using glass disk as a device and a randomly chosen sample as contaminant, we could successfully determine the source of contaminant by deducting the glass disk spectrum and comparing it with databases. In this experiment, each of materials produces a fingerprint that can be used to identify potential sources of contamination.
  • Keywords
    Fourier transform spectroscopy; clean rooms; database management systems; electronic engineering computing; infrared spectra; infrared spectroscopy; surface contamination; Fourier transformed infrared spectroscopy; IR absorption spectrum; cleanroom contamination monitoring; glass disk spectrum; infrared absorption spectra; reference databases; Contamination; Databases; Electromagnetic wave absorption; Fingerprint recognition; Fourier transforms; Glass; Infrared spectra; Monitoring; Spectroscopy; Vibration measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Electronics, 2004. ICSE 2004. IEEE International Conference on
  • Print_ISBN
    0-7803-8658-2
  • Type

    conf

  • DOI
    10.1109/SMELEC.2004.1620901
  • Filename
    1620901