DocumentCode
1703695
Title
Cleanroom contamination monitoring using FTIR
Author
Basri, Mohd Juhari bin Mat ; Yee, Wong Yuen ; Majlis, Burhanuddin Yeop
Author_Institution
Inst. of Microeng. & Nanoelectron., Universiti Kebangsaan Malaysia, Selangor, Malaysia
fYear
2004
Abstract
Fourier transformed infrared spectroscopy (FTIR) was used to obtain spectrum of some consumable products used in the Institute of Microengineering and Nanoelectronics (IMEN) cleanroom at UKM. These spectra are used as reference FTIR databases. Random samples were extracted from that consumable products and tested using FTIR to get sample spectra. These sample spectra were then used as "fingerprints" to determine the identity of contaminants by matching the IR absorption spectrum with reference databases. All reference gave reproducible characteristic infrared absorption spectra. The samples showed close similarity of spectrum corresponding to the source of extraction. While using glass disk as a device and a randomly chosen sample as contaminant, we could successfully determine the source of contaminant by deducting the glass disk spectrum and comparing it with databases. In this experiment, each of materials produces a fingerprint that can be used to identify potential sources of contamination.
Keywords
Fourier transform spectroscopy; clean rooms; database management systems; electronic engineering computing; infrared spectra; infrared spectroscopy; surface contamination; Fourier transformed infrared spectroscopy; IR absorption spectrum; cleanroom contamination monitoring; glass disk spectrum; infrared absorption spectra; reference databases; Contamination; Databases; Electromagnetic wave absorption; Fingerprint recognition; Fourier transforms; Glass; Infrared spectra; Monitoring; Spectroscopy; Vibration measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Electronics, 2004. ICSE 2004. IEEE International Conference on
Print_ISBN
0-7803-8658-2
Type
conf
DOI
10.1109/SMELEC.2004.1620901
Filename
1620901
Link To Document