• DocumentCode
    17038
  • Title

    Combining Operational and Debug Testing for Improving Reliability

  • Author

    Cotroneo, Domenico ; Pietrantuono, Roberto ; Russo, S.

  • Author_Institution
    Dept. of Electr. Eng. & Inf. Technol., Univ. of Naples “Federico II”, Naples, Italy
  • Volume
    62
  • Issue
    2
  • fYear
    2013
  • fDate
    Jun-13
  • Firstpage
    408
  • Lastpage
    423
  • Abstract
    This paper addresses the challenge of reliability-driven testing, i.e., of testing software systems with the specific objective of increasing its operational reliability. We first examined the most relevant approach oriented toward this goal, namely operational testing. The main issues that in the past hindered its wide-scale adoption and practical application are first discussed, followed by the analysis of its performance under different conditions and configurations. Then, a new approach conceived to overcome the limits of operational testing in delivering high reliability is proposed. The two testing strategies are evaluated probabilistically, and by simulation. Results report on the performance of operational testing when several involved parameters are taken into account, and on the effectiveness of the new proposed approach in achieving better reliability. At a higher level, the findings of the paper also suggest that a different view of the testing for reliability improvement concept may help to devise new testing approaches for high-reliability, demanding systems.
  • Keywords
    program debugging; program testing; software reliability; statistical testing; debug testing; demanding systems; high reliability; high-reliability; operational testing; reliability improvement concept; reliability-driven testing; software systems testing; wide-scale adoption; Estimation error; Probabilistic logic; Probability distribution; Software; Software reliability; Testing; Debug testing; operational testing; reliability testing; statistical testing;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2013.2257051
  • Filename
    6497086