• DocumentCode
    1703877
  • Title

    5.5GHz system z microprocessor and multi-chip module

  • Author

    Warnock, J. ; Chan, Y.H. ; Harrer, Hubert ; Rude, D. ; Puri, R. ; Carey, Sean ; Salem, Gerard ; Mayer, G. ; Yiu-Hing Chan ; Mayo, M. ; Jatkowski, A. ; Strevig, G. ; Sigal, Leonid ; Datta, Amitava ; Gattiker, Anne ; Bansal, Ankur ; Malone, David ; Strach,

  • Author_Institution
    IBM Syst. & Technol. Group, Yorktown Heights, NY, USA
  • fYear
    2013
  • Firstpage
    46
  • Lastpage
    47
  • Abstract
    The new System z microprocessor chip (“CP chip”) features a high-frequency processor core running at 5.5GHz in a 32nm high-κ CMOS technology [1], using 15 levels of metal. This chip is a successor to the 45nm product [2], with significant improvements made to the core and nest (i.e. the logic external to the cores) in order to increase the performance and throughput of the design. Also, special considerations were necessary to ensure robust circuit operation in the high-κ technology used for implementation. As seen in the die photo, the chip contains 6 processor cores (compared to 4 cores in the 45nm version), and a large shared 48MB DRAM L3 cache. Each core includes a pair of data and instruction L2 SRAM caches of 1MB each. In addition, the chip contains a memory control unit (MCU), an I/O bus controller (GX), and two sets of interfaces to the L4 cache chips (also in 32nm technology). The CP chip occupies 598 mm2, contains about 2.75B transistors, and has 1071 signal IOs.
  • Keywords
    CMOS integrated circuits; field effect MMIC; high-k dielectric thin films; microprocessor chips; multichip modules; CP chip; DRAM L3 cache; I/O bus controller; L4 cache chips; MCU; frequency 5.5 GHz; high-κ CMOS technology; high-frequency processor; instruction L2 SRAM caches; memory control unit; multichip module; processor cores; signal IO; size 32 nm; size 45 nm; storage capacity 1 Mbit; storage capacity 48 Mbit; system Z-microprocessor chip; transistors; CMOS integrated circuits; Logic gates; Program processors; Reliability; Routing; Stress; Synchronization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2013 IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0193-6530
  • Print_ISBN
    978-1-4673-4515-6
  • Type

    conf

  • DOI
    10.1109/ISSCC.2013.6487630
  • Filename
    6487630