• DocumentCode
    1703890
  • Title

    PENTAG-a Petri net based automatic test pattern generator for sequential digital circuits

  • Author

    Witts, G. ; Alshahib, I.

  • Author_Institution
    Sch. of Eng., Oxford Brookes Univ., UK
  • fYear
    1993
  • fDate
    5/28/1993 12:00:00 AM
  • Firstpage
    42644
  • Lastpage
    42648
  • Abstract
    Describes an automatic test pattern generation program for sequential digital circuits using a modified implementation of Petri nets. This is achieved by the insertion of a FAN transition to the Petri net model. The resultant system compares favourably (12% more coverage and 30% faster) with similar ATPG programs based on the established D-algorithm path sensitization technique
  • Keywords
    Petri nets; automatic testing; integrated circuit testing; logic testing; sequential circuits; ATPG programs; FAN transition; Petri net; automatic test pattern generator; coverage; sequential digital circuits;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Testing-the Gordian Knot of VLSI Design, IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • Filename
    280383
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1703890