Design for testability of mixed-mode ASICs

Research at the University of Huddersfield is concentrating on developing DFT techniques applicable to mixed-mode ASICs. The main focus of the work is concerned with applying transient response testing (TRT) to embedded analogue macros, with system transfer function characterisation in mind, as well as go/no-go testing. TRT is a functional test of an analogue system, where an approximated impulse is injected into the input of a macro, with a resultant excitation at its output. This output is the convolution of the input with the macros transfer function. If the input appears impulsive to the macro i.e. the pulse bandwidth is much greater than the macros bandwidth, then the output response approximates to the macros impulse response, which details the macros functionality in the time domain. From this, macro information such as bandwidth, Q factor etc. can be ascertained. This paper details the implementation of the TRT technique with regards to fault simulations and functional simulations of analogue macros