Title :
Sensitivity Of GaAs Impatt Diodes To Variations In Design Parameters
Author :
Mock, Philip M. ; Trew, Robert J. ; Neece, Robert T.
Author_Institution :
North Carolina State University
Keywords :
Computational modeling; Computer simulation; Design engineering; Diodes; Epitaxial growth; Frequency conversion; Gallium arsenide; Laboratories; Radio frequency; Voltage;
Conference_Titel :
High Speed Semiconductor Devices and Circuits, 1987. Proceedings., IEEE/Cornell Conference on Advanced Concepts in
Conference_Location :
Ithaca, NY, USA
DOI :
10.1109/CORNEL.1987.721251
