Title :
On the design of a resistive bridging fault testable two-rail checker
Author :
Olson, Michael ; Sun, Xiaoling
Author_Institution :
Dept. of Electr. Eng., Alberta Univ., Edmonton, Alta., Canada
Abstract :
This paper describes the design of a built-in current sensor that is used to enhance the resistive bridging fault detectability of a static CMOS TSC two-rail checker. The design and operation of the sensor is discussed. The performance of the sensor-equipped checker is evaluated and compared to a previously designed checker
Keywords :
CMOS digital integrated circuits; built-in self test; electric current; electric resistance; electric sensing devices; integrated circuit testing; built-in current sensor; resistive bridging fault detectability; resistive bridging fault testable two-rail checker; sensor equipped checker; static CMOS TSC two-rail checker; CMOS logic circuits; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Logic circuits; Logic design; Monitoring; Steady-state; Sun;
Conference_Titel :
Electrical and Computer Engineering, 1995. Canadian Conference on
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-2766-7
DOI :
10.1109/CCECE.1995.528090
