• DocumentCode
    1704450
  • Title

    Modeling the overshooting effect in the submicron CMOS inverters

  • Author

    Huang, Zhangcai ; Kurokawa, Akira ; Inoue, Yasuyuki

  • Author_Institution
    Graduate Sch. of Inf., Production & Syst., Waseda Univ., Fukuoka, Japan
  • Volume
    2
  • fYear
    2005
  • Lastpage
    1195
  • Abstract
    The modeling of gate delays has always been one of the most difficult and market-sensitive works. In submicron designs, the second-order effects such as the input-to-output coupling capacitance have a significant influence on gate delay as shown in this paper. However, the accurate analysis of. the input-to-output coupling, capacitance effect has not been presented in previous research. In this paper, an analytical model for the influence of input-to-output coupling capacitance on CMOS inverter delay is proposed, in which a novel algorithm for computing overshooting time is given. Experimental results show good agreement with SPICE simulations.
  • Keywords
    CMOS logic circuits; capacitance; logic design; logic gates; gate delays; input-to-output coupling capacitance; modeling; overshooting time; second-order effects; submicron CMOS inverters; CMOS technology; Capacitance; Circuit simulation; Computational modeling; Delay effects; Inverters; Production systems; Semiconductor device modeling; Timing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications, Circuits and Systems, 2005. Proceedings. 2005 International Conference on
  • Print_ISBN
    0-7803-9015-6
  • Type

    conf

  • DOI
    10.1109/ICCCAS.2005.1495321
  • Filename
    1495321