DocumentCode :
1704450
Title :
Modeling the overshooting effect in the submicron CMOS inverters
Author :
Huang, Zhangcai ; Kurokawa, Akira ; Inoue, Yasuyuki
Author_Institution :
Graduate Sch. of Inf., Production & Syst., Waseda Univ., Fukuoka, Japan
Volume :
2
fYear :
2005
Lastpage :
1195
Abstract :
The modeling of gate delays has always been one of the most difficult and market-sensitive works. In submicron designs, the second-order effects such as the input-to-output coupling capacitance have a significant influence on gate delay as shown in this paper. However, the accurate analysis of. the input-to-output coupling, capacitance effect has not been presented in previous research. In this paper, an analytical model for the influence of input-to-output coupling capacitance on CMOS inverter delay is proposed, in which a novel algorithm for computing overshooting time is given. Experimental results show good agreement with SPICE simulations.
Keywords :
CMOS logic circuits; capacitance; logic design; logic gates; gate delays; input-to-output coupling capacitance; modeling; overshooting time; second-order effects; submicron CMOS inverters; CMOS technology; Capacitance; Circuit simulation; Computational modeling; Delay effects; Inverters; Production systems; Semiconductor device modeling; Timing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communications, Circuits and Systems, 2005. Proceedings. 2005 International Conference on
Print_ISBN :
0-7803-9015-6
Type :
conf
DOI :
10.1109/ICCCAS.2005.1495321
Filename :
1495321
Link To Document :
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