DocumentCode :
1704687
Title :
Investigation of performance optimized power trench MOSFETs With Double-Epilayer
Author :
Su, Xizhi ; Feng, Quanyuan
Author_Institution :
Inst. of Microelectron., Southwest Jiaotong Univ., Chengdu, China
Volume :
3
fYear :
2011
Firstpage :
2166
Lastpage :
2169
Abstract :
Double-Epilayer structure were studied for n-channel low-voltage power trench MOSFET,The total specific on-resistance (Rds,on) of U-MOSFET can be reduced by optimizing the Double-Epilayer structure, Let´s elect better intrinsic epitaxial layer thickness and optimizing it, The optimization structure of Double-Epilayer exhibits a 14.9% reduction in the ON-resistance while maintaining essentially the same blocking voltage as the tranditional trench power MOSFET and improving the switching characteristics by reducing the quantity of Cgd Rds,on.
Keywords :
optimisation; power MOSFET; U-MOSFET; double-epilayer structure; n-channel low-voltage power trench MOSFET; on-resistance; optimization structure; performance optimized power trench MOSFET; Automotive engineering; Silicon; Silicon germanium; Switches; Double-Epilayer; Power Trench MOSFET (U-MOSFET); blocking voltage; specific on-resistance (Rds,on); switching characteristics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Power System Automation and Protection (APAP), 2011 International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-9622-8
Type :
conf
DOI :
10.1109/APAP.2011.6180839
Filename :
6180839
Link To Document :
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