• DocumentCode
    1704687
  • Title

    Investigation of performance optimized power trench MOSFETs With Double-Epilayer

  • Author

    Su, Xizhi ; Feng, Quanyuan

  • Author_Institution
    Inst. of Microelectron., Southwest Jiaotong Univ., Chengdu, China
  • Volume
    3
  • fYear
    2011
  • Firstpage
    2166
  • Lastpage
    2169
  • Abstract
    Double-Epilayer structure were studied for n-channel low-voltage power trench MOSFET,The total specific on-resistance (Rds,on) of U-MOSFET can be reduced by optimizing the Double-Epilayer structure, Let´s elect better intrinsic epitaxial layer thickness and optimizing it, The optimization structure of Double-Epilayer exhibits a 14.9% reduction in the ON-resistance while maintaining essentially the same blocking voltage as the tranditional trench power MOSFET and improving the switching characteristics by reducing the quantity of Cgd Rds,on.
  • Keywords
    optimisation; power MOSFET; U-MOSFET; double-epilayer structure; n-channel low-voltage power trench MOSFET; on-resistance; optimization structure; performance optimized power trench MOSFET; Automotive engineering; Silicon; Silicon germanium; Switches; Double-Epilayer; Power Trench MOSFET (U-MOSFET); blocking voltage; specific on-resistance (Rds,on); switching characteristics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Power System Automation and Protection (APAP), 2011 International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-9622-8
  • Type

    conf

  • DOI
    10.1109/APAP.2011.6180839
  • Filename
    6180839