• DocumentCode
    1705125
  • Title

    Exploring Ridge Curvature for Fingerprint Indexing

  • Author

    Biswas, Soma ; Ratha, Nalini K. ; Aggarwal, Gaurav ; Connell, Jonathan

  • Author_Institution
    Center for Autom. Res., Univ. of Maryland, College Park, MD
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    One of the main challenges in building an efficient and scalable automatic fingerprint identification system is to identify features which are highly discriminative and are reproducible across different prints of the same finger. Most existing fingerprint matching approaches rely on minutiae geometry. Relatively, little effort has gone into analyzing ridge flow patterns present in the fingerprint, partly due to difficulty in extracting robust discriminative features from the fingerprint images. In this paper, we analyze the usefulness of ridge curvature information for fingerprint matching and classification applications. Specifically, for an indexing framework, we explore whether the curvature information can be utilized along with the existing minutiae geometry-based features for further reducing the number of potential candidates for fingerprint identification. Experimental results indicate the robustness of the proposed curvature-based characterization and its usefulness in improving the efficiency of existing fingerprint-based identification systems.
  • Keywords
    computational geometry; database indexing; feature extraction; fingerprint identification; image classification; image matching; fingerprint identification system; fingerprint image matching; fingerprint indexing; image classification; minutiae geometry; ridge curvature information; ridge flow pattern analysis; robust discriminative feature; Data mining; Feature extraction; Fingerprint recognition; Fingers; Geometry; Image analysis; Image matching; Information analysis; Pattern analysis; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biometrics: Theory, Applications and Systems, 2008. BTAS 2008. 2nd IEEE International Conference on
  • Conference_Location
    Arlington, VA
  • Print_ISBN
    978-1-4244-2729-1
  • Electronic_ISBN
    978-1-4244-2730-7
  • Type

    conf

  • DOI
    10.1109/BTAS.2008.4699384
  • Filename
    4699384