Title :
Weighted random pattern testing based on test counts
Author :
Pitchumani, Vijay ; Narayanan, Vinod
Author_Institution :
Dept. of Electr. Comput. Eng., Syracuse Univ., NY, USA
Abstract :
The authors present an algorithm to generate weighted random test patterns based on multiple probability distributions. The algorithm to generate distributions is based on S.B. Akers and B. Krishnamurthy´s test counting method, and has a running time which is linear in the number of gates. The algorithm has been implemented in C, and tested on several of the ISCAS benchmark circuits. The results are significantly superior to both pure random testing, and the weighted random pattern testing reported by R. Lisanke et al. (1986, 1987).<>
Keywords :
logic testing; probability; ISCAS benchmark circuits; multiple probability distributions; running time; test counts; weighted random pattern testing; weighted random test patterns; Benchmark testing; Circuit faults; Circuit testing; Fault detection; Logic testing; Performance evaluation; Probability distribution; Test pattern generators;
Conference_Titel :
Circuits and Systems, 1988., IEEE International Symposium on
Conference_Location :
Espoo, Finland
DOI :
10.1109/ISCAS.1988.14957
