[Front and back covers]

The following topics are dealt with: system-on-chip platform; logic self repair including local interconnects; MOSFET-only switched-capacitor delta-sigma modulators; mixed signal circuit; power amplifiers; automatic test pattern generation; transition faults in non-scan sequential circuits; RF and high-speed circuit design; low-voltage low power double bulk mixer; architecture and symbolic register transfer level synthesis; approximate palindrome detection; packet header analysis and field extraction; field programmable gate arrays (FPGA); memory design and test; flash memories; switched-capacitor circuits; low voltage precharge FPGA circuits; power supply and interconnect related faults; A/D converters; digital phase-locked loop; CMOS amplitude detectors; chaos based image encryption; MEMS devices; fault identification; network-on-chip; analog design and sensors; and offline and online testing.