Title :
Foreword to the 12th IEEE DDECS symposium
Abstract :
Presents the welcome message from the conference proceedings.
Keywords :
CMOS technology; Circuit testing; Computer industry; Conferences; Electronic circuits; Electronic equipment testing; Logic testing; Paper technology; System testing; Technical Councils;
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems, 2009. DDECS '09. 12th International Symposium on
Conference_Location :
Liberec
Print_ISBN :
978-1-4244-3341-4
DOI :
10.1109/DDECS.2009.5012081
