Title :
Limits of gate-level power estimation considering real delay effects and glitches
Author :
Meixner, M. ; Noll, T.G.
Author_Institution :
Electr. Eng. & Comput. Syst., RWTH Aachen Univ., Aachen, Germany
Abstract :
Gate-level power estimation based on foundry-supplied standard cell libraries is a common analysis step during digital design. Surprisingly little is known about the accuracy of this approach and the suitability for different circuit types. At the same time, commercial tools implementing this approach are employed broadly and often regarded as the reference when comparing estimation methodologies on higher levels of abstraction. This work evaluates the suitability and accuracy of gate level power estimators for combinatorial circuits of different logic depths in order to test the ability of handling real gate delay effects. While the basic methodology leads to estimation errors of up to 32 % for the tested circuits, by various improvements in the work flow the accuracy can be improved at the cost of longer runtimes. Apart from recommendations on improving accuracy this work identifies shortcomings in the established approach and highlights circuit characteristics that tend to influence estimation accuracy.
Keywords :
combinational circuits; costing; delay circuits; estimation theory; integrated circuit design; logic gates; power electronics; accuracy evaluation; combinatorial circuits; commercial tools; digital design; foundry-supplied standard cell library; gate-level power estimation error limits; handling real gate delay effects; logic depths; longer runtime cost improvement; real delay glitches; suitability evaluation; tested circuit characteristics; work flow improvements; Benchmark testing; Delays; Estimation; Integrated circuit modeling; Logic gates; Switches; Switching circuits;
Conference_Titel :
System-on-Chip (SoC), 2014 International Symposium on
Conference_Location :
Tampere
DOI :
10.1109/ISSOC.2014.6972437