DocumentCode
1706523
Title
Comparing the robustness of brain connectivity measures to Volume Conduction artifact
Author
Khadem, Ali ; Hossein-Zadeh, Gholam-Ali
Author_Institution
Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran
fYear
2013
Firstpage
209
Lastpage
214
Abstract
EEG and MEG are popular modalities for functional/effective brain connectivity estimation; however they suffer from Volume Conduction (VC) artifact. VC artifact which is an instantaneous linear mixing phenomenon may fake significant electrode couplings that are not due to true brain interactions. An ideal brain connectivity measure must be robust to VC artifact in the sense that it must never yield significant electrode couplings due to VC of independent sources. There are no criteria to compare the robustness of different brain functional/effective connectivity measures to VC artifact in real EEG/MEG datasets. In this paper, we propose a novel measure called Robustness Index (RI) using two surrogate data generation approaches to fill this gap. RI is estimated over both simulated data and real EEG dataset for four functional connectivity measures: the absolute value of Pearson Correlation Coefficient (CC), Mutual Information (MI), magnitude squared Coherence (Coh) and the absolute value of Imaginary part of Coherency (ImC). RI on both datasets has correctly near %100 values for ImC which is theoretically robust to VC artifact. Also, for both datasets, the connectivity measures are ranked by RI as 1-ImC, 2-MI, 3-Coh and 4-CC which is consistent with their robustness levels to VC artifact.
Keywords
biomedical electrodes; electroencephalography; magnetoencephalography; medical signal processing; EEG; MEG; Pearson correlation coefficient; brain effective connectivity; brain functional connectivity; brain interactions; electrode couplings; imaginary coherency part; instantaneous linear mixing; magnitude squared coherence; mutual information; robustness index; surrogate data generation approaches; volume conduction artifact; Brain modeling; Electrodes; Electroencephalography; Indexes; Manganese; Robustness; Brain Connectivity Measures; EEG/MEG; Robustness Index; Surrogate Data; Volume Conduction Artifact;
fLanguage
English
Publisher
ieee
Conference_Titel
Biomedical Engineering (ICBME), 2013 20th Iranian Conference on
Conference_Location
Tehran
Type
conf
DOI
10.1109/ICBME.2013.6782220
Filename
6782220
Link To Document