Title :
A novel voter-based Markov model for reliability assessment of multi-port power electronic interface (MPEI)
Author :
Ranjbar, Amir Hossein ; Shamsi, Pourya ; Fahimi, Babak
Author_Institution :
Univ. of Texas at Dallas, Dallas, TX, USA
Abstract :
In this paper a novel Voter Based Markov model will be presented for evaluation of the reliability in a multi-port power electronic interface. In the new Markov model, a new technique called Voter Based State Reduction (VBSR) technique will be introduced for reducing the number of states in Failure Mode and Effect Analysis (FMEA). The VBSR technique will simplify the reliability analysis of power electronic systems. It will also make the results of the reliability assessment more meaningful. In order to show the effectiveness of the proposed model, reliability of a Multi-port Power Electronics Interface (MPEI) will be evaluated using both conventional and Voter based Markov model. Comparison of FMEA and reliability evaluation results between conventional Markov model and the new Voter Based Markov model confirms the effectiveness of the proposed method.
Keywords :
Markov processes; power electronics; reliability; FMEA; MPEI; VBSR technique; failure mode and effect analysis; multiport power electronic interface; reliability assessment; voter based state reduction technique; voter-based Markov model; Batteries; Markov processes; Measurement; Power electronics; Power system reliability; Reliability; Voltage control;
Conference_Titel :
Vehicle Power and Propulsion Conference (VPPC), 2011 IEEE
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-61284-248-6
Electronic_ISBN :
Pending
DOI :
10.1109/VPPC.2011.6043077