DocumentCode :
1707087
Title :
A bimodal energy model for correcting beam hardening artefacts in X-ray tomography
Author :
Van de Casteele, Elke ; Van Dyck, Dirk ; Sijbers, Jan ; Raman, Erik
Author_Institution :
Dept. of Phys., Antwerp Univ., Belgium
fYear :
2003
Firstpage :
57
Lastpage :
58
Abstract :
As a consequence of the polychromatic X-ray sources, used in micro-computer tomography (μCT) and in medical CT, the attenuation is no longer a linear function of absorber thickness. If this nonlinear beam hardening effect is not compensated, the reconstructed images will be corrupted by cupping artefacts. Here, a bimodal energy model for the energy spectrum is presented, which may be used for reduction of artefacts caused by beam hardening. In essence, this correction method is a linearization technique based on a physical model, where no a priori knowledge about the spectrum of the source is required.
Keywords :
computerised tomography; image reconstruction; linearisation techniques; medical image processing; X-ray tomography; absorber thickness; artefact reduction; attenuation; beam hardening; beam hardening artefacts; bimodal energy model; correction method; cupping artefacts; energy spectrum; linearization technique; medical CT; micro-computer tomography; nonlinear beam hardening effect; physical model; polychromatic X-ray sources; reconstructed images; Attenuation; Biomedical imaging; Composite materials; Computed tomography; Image reconstruction; Inorganic materials; Physics; Polynomials; X-ray imaging; X-ray tomography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Bioengineering Conference, 2003 IEEE 29th Annual, Proceedings of
Print_ISBN :
0-7803-7767-2
Type :
conf
DOI :
10.1109/NEBC.2003.1215990
Filename :
1215990
Link To Document :
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