DocumentCode
1707231
Title
Hybrid modeling and simulation of plant/controller combinations
Author
Schiffelers, R.R.H. ; Pogromsky, A.Y. ; van Beek, D.A. ; Rooda, J.E.
Author_Institution
Eindhoven Univ. of Technol., Eindhoven, Netherlands
fYear
2009
Firstpage
1384
Lastpage
1390
Abstract
In order to design controllers, models of the system to be controlled (the plant), and models of the controller are developed, and the performance of the controlled system is evaluated by means of, for instance, simulation. The plant and controller can be modeled in the continuous-time domain, the discrete-event domain, or in a combination of these two domains, the so-called hybrid domain. It is very convenient to have all these combinations available in one single formalism. In this paper, the hybrid chi (Chi) formalism is introduced and used to model a simple manufacturing system consisting of a production machine that is controlled by a PI controller with anti-windup. The plant is modeled in the continuous-time domain as well as in the discrete-event domain. Likewise, the controller is modeled in both domains. Then, several (hybrid) plant/controller combinations are made. It is shown that the chi language facilitates modeling of these combinations, because the individual plant and controller specifications remain unchanged. The chi simulator is used to obtain the respective simulation results.
Keywords
PI control; continuous time systems; control system synthesis; discrete event systems; manufacturing systems; PI controller; continuous-time domain; controlled system; controller design; discrete-event domain; hybrid modeling; hybrid simulation; manufacturing system; plant-controller combination; production machine; single formalism; Control system synthesis; Control systems; Control theory; Differential equations; Discrete event systems; Embedded system; Fluctuations; Manufacturing systems; Production systems; Sampling methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Control Applications, (CCA) & Intelligent Control, (ISIC), 2009 IEEE
Conference_Location
St. Petersburg
Print_ISBN
978-1-4244-4601-8
Electronic_ISBN
978-1-4244-4602-5
Type
conf
DOI
10.1109/CCA.2009.5281019
Filename
5281019
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