DocumentCode :
1707328
Title :
High temperature, >200°C, polymer film capacitors
Author :
Mandelcorn, L. ; Miller, R.L.
Author_Institution :
Westinghouse Sci. & Technol. Center, Pittsburgh, PA, USA
fYear :
1992
Firstpage :
369
Lastpage :
372
Abstract :
A number of polymer films were evaluated to determine the feasibility of a >200°C AC and DC capacitor dielectric. Small samples of film were checked for their dielectric properties, particularly dissipation-factor-temperature relations between 150°C and 300°C, electric strength, thermal and hydrolytic stability, and potential to be produced in large quantities in thin gauges. A 3M proprietary experimental film, FPE, was found to be the most promising with low dissipation factors between 150°C and 275°C. The criterion for the high temperature usability of this film was its performance in 0.4-μF to 1-μF capacitors as a film-film-foil and metallized film winding. The quality and production of FPE film were upgraded for the capacitor application. This was based on capacitor producibility from FPE film rolls and high temperature life tests under DC and 400 Hz AC stresses, and film producibility and tests. Capacitor failures were of the dielectric puncture type, apparently due to defects which could be minimized. A group of 0.5-μF capacitors was made for operation in a NASA power circuit at 20 kHz and 200°C. The 10-kHz to 100-kHz, dissipation factors of FPE film were very low at 175°C to 300°C, and were found to be very stable under these conditions of operation
Keywords :
capacitors; electric strength; life testing; polymer films; 10 to 100 kHz; 150 to 300 degC; 3M proprietary experimental film; 400 Hz; AC capacitor; AC stresses; DC capacitor dielectric; FPE; NASA power circuit; dielectric puncture failure; dissipation factors; dissipation-factor-temperature; electric strength; film producibility; film-film-foil; high temperature life tests; hydrolytic stability; metallized film winding; polymer film capacitors; thermal stability; Capacitors; Circuit testing; Dielectric thin films; Life testing; Metallization; Polymer films; Production; Temperature; Thermal stability; Usability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Sources Symposium, 1992., IEEE 35th International
Conference_Location :
Cherry Hill, NJ
Print_ISBN :
0-7803-0552-3
Type :
conf
DOI :
10.1109/IPSS.1992.281979
Filename :
281979
Link To Document :
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