• DocumentCode
    1707378
  • Title

    A comprehensive approach for soft error tolerant Four State Logic

  • Author

    Friesenbichler, Werner ; Panhofer, Thomas ; Delvai, Martin

  • Author_Institution
    RUAG Aerosp. Austria GmbH
  • fYear
    2009
  • Firstpage
    214
  • Lastpage
    217
  • Abstract
    The continuing downscaling of integrated circuits makes modern devices more susceptible to soft errors. This paper investigates the possibility of using four-state logic (FSL) to improve the fault tolerance of digital circuits. FSL is a possible implementation of asynchronous quasi delay insensitive (QDI) logic using a more efficient encoding and handshake protocol. The behavior of FSL circuits when subjected to transient faults is analyzed. We present a method based on duplication and rail cross-coupling that allows to detect as well as correct soft errors autonomously. The concept is demonstrated by fault injection experiments.
  • Keywords
    asynchronous circuits; fault tolerance; integrated circuit reliability; integrated logic circuits; radiation hardening (electronics); asynchronous quasi delay insensitive logic; digital circuits; encoding protocol; fault injection; fault tolerance; four state logic circuits; handshake protocol; integrated circuits; rail cross-coupling; soft error tolerant; transient faults; Circuit faults; Delay; Digital circuits; Encoding; Fault tolerance; Logic circuits; Logic devices; Protocols; Rails; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Diagnostics of Electronic Circuits & Systems, 2009. DDECS '09. 12th International Symposium on
  • Conference_Location
    Liberec
  • Print_ISBN
    978-1-4244-3341-4
  • Electronic_ISBN
    978-1-4244-3340-7
  • Type

    conf

  • DOI
    10.1109/DDECS.2009.5012131
  • Filename
    5012131