DocumentCode
1707378
Title
A comprehensive approach for soft error tolerant Four State Logic
Author
Friesenbichler, Werner ; Panhofer, Thomas ; Delvai, Martin
Author_Institution
RUAG Aerosp. Austria GmbH
fYear
2009
Firstpage
214
Lastpage
217
Abstract
The continuing downscaling of integrated circuits makes modern devices more susceptible to soft errors. This paper investigates the possibility of using four-state logic (FSL) to improve the fault tolerance of digital circuits. FSL is a possible implementation of asynchronous quasi delay insensitive (QDI) logic using a more efficient encoding and handshake protocol. The behavior of FSL circuits when subjected to transient faults is analyzed. We present a method based on duplication and rail cross-coupling that allows to detect as well as correct soft errors autonomously. The concept is demonstrated by fault injection experiments.
Keywords
asynchronous circuits; fault tolerance; integrated circuit reliability; integrated logic circuits; radiation hardening (electronics); asynchronous quasi delay insensitive logic; digital circuits; encoding protocol; fault injection; fault tolerance; four state logic circuits; handshake protocol; integrated circuits; rail cross-coupling; soft error tolerant; transient faults; Circuit faults; Delay; Digital circuits; Encoding; Fault tolerance; Logic circuits; Logic devices; Protocols; Rails; Transient analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Diagnostics of Electronic Circuits & Systems, 2009. DDECS '09. 12th International Symposium on
Conference_Location
Liberec
Print_ISBN
978-1-4244-3341-4
Electronic_ISBN
978-1-4244-3340-7
Type
conf
DOI
10.1109/DDECS.2009.5012131
Filename
5012131
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