Title :
Toward a decentralized trust-based access control system for dynamic collaboration
Author :
Adams, William J. ; Davis, Nathaniel J.
Author_Institution :
Bradley Dept. of Electr. & Comput. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Abstract :
As ad-hoc collaborative environments become more common, the need for access control becomes more imperative. Centralized access control determination fails to work in mobile ad-hoc networking environments, as the information necessary for pre-configuration is not available. This situation is exacerbated by the dynamic nature of the environment´s membership, so that the time and resources expended in offline management are largely wasted. This paper presents a decentralized access control system that implements sociological trust constructs in a quantitative system to evaluate interaction partners. A distributed, node-centric approach to reputation management processes nodal behavior feedback and provides a reputation index that nodes use to determine trustworthiness their peers before establishing associations. The availability of a reputation index gives a measure of expectation of a peer´s behavior, based on past performance, and makes a MANET a more distributed operational environment.
Keywords :
ad hoc networks; authorisation; computer network management; groupware; mobile radio; telecommunication security; MANET; ad hoc collaborative environment; decentralized trust-based access control system; distributed node-centric approach; distributed operational environment; dynamic collaboration; interaction partners; mobile ad hoc network; nodal behavior feedback; offline management; peer trustworthiness; reputation index; reputation management; sociological trust; trust management; Access control; Availability; Collaboration; Collaborative work; Environmental management; Feedback; Mobile ad hoc networks; Peer to peer computing; Resource management; Waste management;
Conference_Titel :
Information Assurance Workshop, 2005. IAW '05. Proceedings from the Sixth Annual IEEE SMC
Print_ISBN :
0-7803-9290-6
DOI :
10.1109/IAW.2005.1495969