DocumentCode :
1707479
Title :
A proposal for modeling substrate coupling in Si-MMICs and its experimental verification up to 40 GHz
Author :
Pfost, M. ; Rein, H.M.
Author_Institution :
Ruhr-Univ., Bochum, Germany
fYear :
1997
Firstpage :
52
Lastpage :
55
Abstract :
Semi-physical equivalent circuits for modeling substrate coupling in the design of Si bipolar MMICs are proposed. The model parameters can be calculated for arbitrary layout configurations. Some of them are determined from area- and length-specific capacitances, measured on test structures, while others are calculated by use of a new numerical simulator called SUSI. Both the simulator and the equivalent circuits have been experimentally verified up to 40 GHz. For this, special test structures were designed and fabricated
Keywords :
bipolar MMIC; circuit analysis computing; elemental semiconductors; equivalent circuits; integrated circuit layout; integrated circuit modelling; integrated circuit testing; silicon; 40 GHz; IC modeling; SUSI; Si; Si bipolar MMICs; model parameters; numerical simulator; semi-physical equivalent circuits; substrate coupling; test structures; Area measurement; Capacitance measurement; Circuit simulation; Circuit testing; Coupling circuits; Equivalent circuits; Length measurement; MMICs; Numerical simulation; Proposals;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronic Test Structures, 1997. ICMTS 1997. Proceedings. IEEE International Conference on
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-3243-1
Type :
conf
DOI :
10.1109/ICMTS.1997.589332
Filename :
589332
Link To Document :
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