DocumentCode
1707602
Title
Sputter heating in ionized metal physical vapor deposition
Author
Junqing Lu ; Kushner, M.J.
Author_Institution
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
fYear
1999
Firstpage
100
Abstract
Summary form only given. In this paper, sputter heating and subsequent rarefaction in IMPVD reactors is investigated using a plasma equipment model. The Hybrid Plasma Equipment Model has been improved to include processes relevant to sputter heating. Specifically, the algorithms for yields and sputtered atom energies have been improved to account for the ion identity and energy as a function of position on the target. The transport and slowing of sputtered atoms is addressed using a Monte Carlo simulation. By collecting statistics on the energy and momenta of slowing sputtered atoms before and after a collision, rates of momentum transfer and random heating of the gas are computed. These quantities are then used in the momenta and energy equations for neutral and ion species. Parametric studies have been performed for sputter heating in aluminum and copper IMPVD systems operating at low to high powers (/spl les/1200 W ICP, /spl les/2500 W magnetron) in 10s mTorr Ar. When operating with ICP excitation only, gas temperatures of 800 K are typically obtained with powers of >1 kW. Additional temperature rises of 500-1500 K from sputter heating can be obtained, depending on the magnetron power and accommodation coefficient of the gas on the walls.
Keywords
Monte Carlo methods; digital simulation; energy loss of particles; heating; plasma deposition; plasma materials processing; sputter deposition; sputtering; vapour deposition; 1 kW; 1200 W; 2500 W; 500 to 1500 K; Al; Cu; IMPVD reactors; Monte Carlo simulation; accommodation coefficient; algorithms; aluminum; atom slowing; atom transport; copper; energy statistics; gas temperatures; hybrid plasma equipment model; ion energy; ion identity; ion position; ionized metal physical vapor deposition; magnetron power; momentum statistics; momentum transfer rates; parametric studies; plasma equipment model; random heating rates; rarefaction; slowing sputtered atoms; sputter heating; sputtered atom energies; temperature rises; yields; Atomic layer deposition; Chemical vapor deposition; Equations; Heat transfer; Heating; Inductors; Parametric statistics; Parametric study; Plasma temperature; Plasma transport processes;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 1999. ICOPS '99. IEEE Conference Record - Abstracts. 1999 IEEE International Conference on
Conference_Location
Monterey, CA, USA
ISSN
0730-9244
Print_ISBN
0-7803-5224-6
Type
conf
DOI
10.1109/PLASMA.1999.829301
Filename
829301
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