DocumentCode :
170778
Title :
Design and analysis of heat dissipation of LED back light module
Author :
Zheng, C.E. ; Peng, Y.L. ; Tsai, M.Y. ; Tsai, Y.Y. ; Chen, C.H.
Author_Institution :
Dept. of Mech. Eng., Chang Gung Univ., Taoyuan, Taiwan
fYear :
2014
fDate :
24-26 Sept. 2014
Firstpage :
1
Lastpage :
5
Abstract :
High junction temperature in the LEDs would lead to the reliability problems, such as low quantum efficiency, wavelength shifts, short lifetime, and even catastrophic failure. The effects of various parameters, such as thermal properties of substrates, thermal interface materials (TIM) and heat sinks on the thermal performance of the LED backlight module are investigated experimentally and numerically in this study. These LED backlight modules are evaluated in terms of Tj and thermal resistance experimentally by junction temperature tester and IR Thermal Imager, and numerically by CF design simulation. The related junction temperature (Tj) and thermal resistances (Rj-a) for these LED modules are obtained from experimental measurements and simulation. It is found that Rj-a can be significantly reduced by using the heat sinks for all the cases. The results also indicate that the use of Al or Fe heat sinks with any substrates and TIMs do not show any difference in heat dissipation of the module. However, the use of Al or Flex substrate can lower the thermal resistance (Rj-a) by ~32% compared with that using PCB substrate. Furthermore, the simulation validated by surface temperature data of IR Thermal Imager can predict a similar trend of thermal behaviour of LED modules with different substrates and heat sinks and also provides detailed temperature fields of full-scale LED backlight modules.
Keywords :
aluminium; cooling; failure analysis; heat sinks; integrated circuit reliability; iron; light emitting diodes; printed circuits; thermal resistance; Al; Al heat sinks; Fe; Fe heat sinks; LED back light module; LED modules; PCB substrate; TIM; catastrophic failure; full-scale LED backlight modules; heat dissipation; junction temperature; reliability problems; surface temperature data; thermal imager; thermal interface materials; thermal performance; thermal resistance; Heat sinks; Junctions; Light emitting diodes; Substrates; Temperature; Temperature measurement; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal Investigations of ICs and Systems (THERMINIC), 2014 20th International Workshop on
Conference_Location :
London
Type :
conf
DOI :
10.1109/THERMINIC.2014.6972510
Filename :
6972510
Link To Document :
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