Title :
The Application of EESM and MI-Based Link Quality Models for Rate Compatible LDPC Codes
Author :
Chen, Xiang ; Wan, Lei ; Gao, Zhenyuan ; Fei, Zesong ; Kuang, Jingming
Author_Institution :
Beijing Inst. of Technol., Beijing
Abstract :
System evaluation of different resource allocation, power control and link adaptation (LA) solutions require the multi-cell system simulations, which provide important reference to the standardization and system design. Such a system-level simulator is expected to be reliable and quick enough, which requires a very accurate and simple link quality model. The exponential effective-SNR mapping (EESM) model [1, 2] and mutual information-based (MI-based) model [3] were proposed recently, which have been proved to be pretty accurate and independent of fading for 3 GPP Turbo-coded orthogonal frequency division multiplexing (OFDM) system [3, 4]. This paper investigates the accuracies of the above two models for the low-density parity-check (LDPC) codes, in terms of veracity and complexity for different coding rates, block lengths, mobile speeds and modulation schemes. Simulation results verify that both methods show quite good performance in different multi-state channels. The simpler MI-based model performs even better. Especially its coding model is independent of modulation schemes.
Keywords :
3G mobile communication; OFDM modulation; fading channels; parity check codes; resource allocation; turbo codes; 3 GPP turbo-coded orthogonal frequency division multiplexing system; EESM model; MI-based model; OFDM system; exponential effective-SNR mapping model; fading channel; link adaptation quality model; low-density parity-check codes; multicell system simulation; multistate channel; mutual information-based model; power control; rate compatible LDPC codes; resource allocation; Fading; Modulation coding; OFDM; Parity check codes; Power control; Power system modeling; Power system reliability; Resource management; Standardization; Turbo codes;
Conference_Titel :
Vehicular Technology Conference, 2007. VTC-2007 Fall. 2007 IEEE 66th
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4244-0263-2
Electronic_ISBN :
1090-3038
DOI :
10.1109/VETECF.2007.276