DocumentCode :
170810
Title :
Towards electro-thermo-mechanical simulation of integrated circuits in standard CAD environment
Author :
Garci, Maroua ; Kammerer, Jean-Baptiste ; Hebrard, Luc
Author_Institution :
ICube, Strasbourg, France
fYear :
2014
fDate :
24-26 Sept. 2014
Firstpage :
1
Lastpage :
5
Abstract :
Through mechanical coupling, thermal effects can lead to drift in circuits´ electrical performances, as well as integrated circuits reliability issues. It is thus necessary to consider thermal, mechanical and electrical effects all together in a self-consistent manner, This work focuses on the electro-thermo-mechanical simulation of integrated circuits in the target of ICs reliability monitoring from the early design stages. An electro-thermo-mechanical simulation tool was developed using the Cadence® environment and the Spectre® simulator. The simulation principle is based on the direct simulation approach with a mixed compact and finite elements modelling. Three networks, i.e. the electrical, the thermal and the mechanical networks, are directly generated, coupled then simulated using a single simulator, i.e. Spectre®. This paper discusses our networks modelling approaches. The way the three networks are coupled and simulated is described. The thermo-mechanical model is validated through simulation results, compared with results obtained using COMSOL® A first thermo-mechanical simulation of a simple integrated circuit featuring a power device is presented.
Keywords :
circuit CAD; circuit simulation; finite element analysis; integrated circuit modelling; integrated circuit reliability; COMSOL; Cadence environment; IC reliability monitoring; Spectre simulator; circuit electrical performances; direct simulation approach; electrical effects; electrothermomechanical simulation tool; finite element modelling; integrated circuit reliability; integrated circuits; mechanical coupling; mechanical effects; mechanical networks; mixed compact modelling; power device; single simulator; standard CAD environment; thermal effects; Integrated circuit modeling; Silicon; Simulation; Solid modeling; Thermomechanical processes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal Investigations of ICs and Systems (THERMINIC), 2014 20th International Workshop on
Conference_Location :
London
Type :
conf
DOI :
10.1109/THERMINIC.2014.6972526
Filename :
6972526
Link To Document :
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