Title :
Study, design and validation of integrated near-field probes for EMC investigation on a power hybrid structure
Author :
Lourdel, Guillaume ; Dienot, Jean-Marc
Author_Institution :
Power Electron. Associated Res. Lab., ALSTOM Transp. SA, Tarbes, France
Abstract :
The paper concerns the first design study of integrated near-field probes close to IGBT chips, in order to access magnetic-field measurement into a complex power hybrid structure, close to IGBT chips. This work is then related to an EMC simulation methodology (X.VI.CE) according to the behavior of electromagnetic coupling, which should provide pertinent EMC investigations for future semiconductor power electronics design.
Keywords :
bipolar transistor circuits; electromagnetic compatibility; electromagnetic coupling; hybrid integrated circuits; magnetic field measurement; power convertors; power integrated circuits; probes; EMC simulation methodology; IGBT chips; electromagnetic coupling; integrated near-field probes; magnetic-field measurement; power converter integration; power hybrid structure; semiconductor power electronics design; Circuit simulation; Coupling circuits; Electromagnetic compatibility; Insulated gate bipolar transistors; Laboratories; Power electronics; Power measurement; Probes; Pulse width modulation converters; Switches;
Conference_Titel :
Electromagnetic Compatibility, 2004. EMC 2004. 2004 InternationalSymposium on
Print_ISBN :
0-7803-8443-1
DOI :
10.1109/ISEMC.2004.1349814
