Study, design and validation of integrated near-field probes for EMC investigation on a power hybrid structure

Author

Lourdel, Guillaume ; Dienot, Jean-Marc

Author_Institution

Power Electron. Associated Res. Lab., ALSTOM Transp. SA, Tarbes, France

Volume

2

fYear

2004

Firstpage

353

Abstract

The paper concerns the first design study of integrated near-field probes close to IGBT chips, in order to access magnetic-field measurement into a complex power hybrid structure, close to IGBT chips. This work is then related to an EMC simulation methodology (X.VI.CE) according to the behavior of electromagnetic coupling, which should provide pertinent EMC investigations for future semiconductor power electronics design.

Keywords

bipolar transistor circuits; electromagnetic compatibility; electromagnetic coupling; hybrid integrated circuits; magnetic field measurement; power convertors; power integrated circuits; probes; EMC simulation methodology; IGBT chips; electromagnetic coupling; integrated near-field probes; magnetic-field measurement; power converter integration; power hybrid structure; semiconductor power electronics design; Circuit simulation; Coupling circuits; Electromagnetic compatibility; Insulated gate bipolar transistors; Laboratories; Power electronics; Power measurement; Probes; Pulse width modulation converters; Switches;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 2004. EMC 2004. 2004 InternationalSymposium on

Print_ISBN

0-7803-8443-1

Type

conf

DOI

10.1109/ISEMC.2004.1349814

Filename

1349814