Title :
A Wavelet Transform Method for Characterization of Voltage Variations
Author :
Zhu, H.Y. ; Chen, S.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
Abstract :
Short duration voltage variation is one of the most commonly encountered power quality disturbances. The severity is generally determined by the remaining voltage RMS magnitude and the duration of the disturbance. These are generally determined through the RMS measurement method, which at times faces difficulties especially with variations of very short duration. This paper proposes an alternative technique to effectively characterize voltage variations of all durations. It uses wavelet analysis to zoom into a high frequency band for the time information, and the fundamental frequency band for the magnitude change. It is shown to be effective even for very short interruption, which is difficult to determine using the RMS method. Compared to other wavelet methods, its low computational requirement makes it suitable for real-time application. Dynamic simulations were used to demonstrate the capability of this method.
Keywords :
power supply quality; power system measurement; power system transients; wavelet transforms; dynamic simulation; fundamental frequency band; high-frequency band; power quality disturbances; short-duration voltage variation characterization; wavelet transform method; Discrete wavelet transforms; Energy measurement; Frequency; Multiresolution analysis; Power quality; Power system transients; Programmable control; Voltage fluctuations; Wavelet analysis; Wavelet transforms; Power quality; voltage variations; wavelet analysis;
Conference_Titel :
Power System Technology, 2006. PowerCon 2006. International Conference on
Conference_Location :
Chongqing
Print_ISBN :
1-4244-0110-0
Electronic_ISBN :
1-4244-0111-9
DOI :
10.1109/ICPST.2006.321959