Title :
Spherically curved crystals for X-ray plasma diagnostics
Author :
Aglitskiy, Yefim ; Lehecka, T. ; Obenschain, S. ; Pawley, C. ; Brown, Cordelia M. ; Seely, John
Author_Institution :
Sci. Applications Int. Corp., McLean, VA, USA
Abstract :
Summary form only given. We report on our continued development of the X-ray plasma diagnostics based on spherically curved crystals. The diagnostics include X-ray spectroscopy with 1D spatial resolution and 2D monochromatic self-imaging and backlighting. The system is currently used, but not limited to diagnostics of the targets ablatively accelerated by the NRL Nike KrF laser.
Keywords :
Stark effect; X-ray optics; X-ray spectroscopy; mica; plasma diagnostics; quartz; spectral line broadening; time resolved spectra; 1D spatial resolution; 2D monochromatic self-imaging; CH planar targets; NRL Nike KrF laser; X-ray optical system; X-ray plasma diagnostics; X-ray spectroscopy; ablatively accelerated targets; backlighting; developing instabilities; focal spots; four-strip X-ray framing camera; low density foam targets; mica; plasma instability development; quartz crystal; spatial resolution; spherically curved crystals; Cameras; Crystals; Laboratories; Optical imaging; Plasma applications; Plasma diagnostics; Resonance; Spatial resolution; X-ray imaging; X-ray lasers;
Conference_Titel :
Plasma Science, 1999. ICOPS '99. IEEE Conference Record - Abstracts. 1999 IEEE International Conference on
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7803-5224-6
DOI :
10.1109/PLASMA.1999.829353
