An injection-locked-oscillator phase discriminator for RF built-in self test on local oscillator phase noise

Author

Yen-Ju Chen ; Ta-Shun Chu

Author_Institution

Nat. Tsing Hua Univ., Hsinchu, Taiwan

fYear

2014

fDate

1-6 June 2014

Firstpage

1

Lastpage

4

Abstract

The analysis, design, and implementation of an RF built-in self-test (BIST) bench on local oscillator phase noise are presented. An injection-locked-oscillator phase discriminator integrated with a 2.56GHz phase-locked loop in 65nm CMOS is proposed in this bench. The proposed phase discriminator occupies an area of 0.38 mm×0.38 mm and consumes 3.8 mW of power. The RF-BIST bench provides the phase noise profile with 1.5dB, 1.4dB, and 2.7dB errors at 100kHz, 1MHz, and 10MHz offset frequencies respectively.

Keywords

CMOS analogue integrated circuits; UHF integrated circuits; UHF oscillators; built-in self test; discriminators; injection locked oscillators; integrated circuit design; integrated circuit testing; phase locked loops; phase noise; RF built-in self test; RF-BIST bench; frequency 2.56 GHz; injection-locked-oscillator phase discriminator; local oscillator phase noise; phase noise profile; phase-locked loop; power 3.8 mW; size 65 nm; Delays; Digital signal processing; Mixers; Phase noise; Radio frequency; System-on-chip; built-in self test (BIST); injection locking; oscillator; phase discriminator; phase noise;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium (IMS), 2014 IEEE MTT-S International

Conference_Location

Tampa, FL

Type

conf

DOI

10.1109/MWSYM.2014.6848248

Filename

6848248