Title :
A full E-band low noise amplifier realized by using novel wafer-level chip size package technology suitable for reliable flip-chip reflow-soldering
Author :
Kawasaki, T. ; Kubota, Minoru ; Tsukashima, K. ; Tokumitsu, T. ; Hasegawa, Yohei
Author_Institution :
Sumitomo Electr. Ind. Ltd., Yokohama, Japan
Abstract :
Cost effective E-band Low Noise Amplifier (LNA) using a three-dimensional (3-D) MMIC technology and wafer level chip size package (WLCSP) technology is presented. The reflow-soldering compatibility of the technology makes MMIC assembly on PCB very simple and significantly contributes to mass production of receivers and transmitters. The applied 3-D MMIC design effectively shrinks the die sizes. The newly designed LNA exhibited an on-chip gain of 22.5 ± 1 dB and a noise figure of 4.0 ± 0.3 dB in the full E-band. The measurements of the assembled LNA, including extended transmission lines on PCB, exhibited a gain of 21 ± 1 dB and a noise figure of 4.6 ± 0.2 dB. Eliminating the extended transmission line losses of about 0.3 dB × 2, the noise figure increase due to assembly was only 0.3 dB. These results show that the LNA using the 3-D WLCSP technology is valuable for E-band application in terms of not only cost reduction but also practical performance achievement.
Keywords :
MMIC amplifiers; flip-chip devices; integrated circuit design; low noise amplifiers; printed circuits; reflow soldering; three-dimensional integrated circuits; wafer level packaging; 3D MMIC design; 3D WLCSP technology; LNA; PCB; cost effective E-band low noise amplifier; cost reduction; die sizes; extended transmission lines; full E-band low noise amplifier; mass production; receivers; reliable flip-chip reflow-soldering; three-dimensional MMIC technology; transmission line losses; transmitters; wafer-level chip size package technology; Assembly; Coplanar waveguides; Europe; HEMTs; Logic gates; MMICs; System-on-chip; 3-D MMIC; E-band; HEMT; LNA; WLCSP; noise figure; solder bump;
Conference_Titel :
Microwave Symposium (IMS), 2014 IEEE MTT-S International
Conference_Location :
Tampa, FL
DOI :
10.1109/MWSYM.2014.6848255