DocumentCode :
1709363
Title :
A comparison of heat outputs attributed to lithium film formation and repair in Li/SOCl2 and Li/MnO2 cells
Author :
Kronenberg, M.L. ; Baker, J.W. ; Rissmiller, P. ; Bytella, J.
Author_Institution :
Catalyst Res., Sparks, MD, USA
fYear :
1992
Firstpage :
60
Lastpage :
63
Abstract :
Heat output measurements were taken following partial discharges or short circuit tests on Li/SOCl2 and on Li/MnO2 cells. The magnitude and change in heat output with time is contrasted using examples from these two basically different systems. The magnitude and duration of the heat output is related to the nature of the film that is undergoing repair and rebuilding on the lithium anode. In the case of Li/SOCl2, the film forming reaction is the same as the normal discharge reaction, so heat output information can be used to estimate losses in lithium anode capacity attributed to film formation and repair during storage or following intermittent discharges. However, the solvent reaction with lithium is quite different from the normal discharge reaction in lithium cells using solid cathodes and organic solvent based electrolytes. The data show that heat outputs following partial discharge or short circuit are much higher for Li/SOCl2 than for Li/MnO2 cells. However, for both of these cell types, formation and repair data are mostly related to the secondary film layer rather than the thin, compact primary layer
Keywords :
electrochemical electrodes; electrochemistry; electrolytes; lithium; manganese compounds; partial discharges; primary cells; sulphur compounds; testing; Li-MnO2; Li-SOCl2; anode; capacity; electrochemistry; electrolytes; film formation; film repair; heat outputs; losses; organic solvent; partial discharges; primary cells; short circuit tests; solid cathodes; solvent reaction; storage; testing; Anodes; Cathodes; Circuit testing; Equations; Life estimation; Lithium compounds; Partial discharges; Polymer films; Solids; Solvents;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Sources Symposium, 1992., IEEE 35th International
Conference_Location :
Cherry Hill, NJ
Print_ISBN :
0-7803-0552-3
Type :
conf
DOI :
10.1109/IPSS.1992.282054
Filename :
282054
Link To Document :
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