Investigating charge trapping properties of combinations of XLPE and semiconductive materials in plaques and cable models

Author

Montanari, Gian ; Laurent, C. ; Teyssedre, G. ; Campus, F. ; Nilsson, U. ; Morshuis, P.H.F. ; Dissado, L.A.

Author_Institution

DIE-LIMAT, Bologna Univ., Italy

Volume

1

fYear

2005

Firstpage

99

Abstract

The results of space charge observations performed on test objects having the purpose to investigate polymeric insulation/semiconductor interfaces under DC electrical field are presented in this paper. Combinations of different crosslinked semiconductor and polyethylene insulating materials, are considered. The test objects consist of plaques with extruded semiconductor and cable models, having inner and outer semiconductor.

Keywords

XLPE insulation; cable insulation; cables (electric); electron traps; hole traps; semiconductor-insulator boundaries; semiconductors; space charge; XLPE; cable models; charge trapping properties; crosslinked semiconducting-polyethylene insulating materials; extruded semiconductor; plaques; polymeric insulation/semiconducting interfaces; semiconducting materials; space charge; Cables; Charge measurement; Current measurement; Dielectrics and electrical insulation; Performance evaluation; Polymers; Pulse measurements; Semiconductor materials; Space charge; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulating Materials, 2005. (ISEIM 2005). Proceedings of 2005 International Symposium on

Print_ISBN

4-88686-063-X

Type

conf

DOI

10.1109/ISEIM.2005.193338

Filename

1496059