Title :
Investigating charge trapping properties of combinations of XLPE and semiconductive materials in plaques and cable models
Author :
Montanari, Gian ; Laurent, C. ; Teyssedre, G. ; Campus, F. ; Nilsson, U. ; Morshuis, P.H.F. ; Dissado, L.A.
Author_Institution :
DIE-LIMAT, Bologna Univ., Italy
Abstract :
The results of space charge observations performed on test objects having the purpose to investigate polymeric insulation/semiconductor interfaces under DC electrical field are presented in this paper. Combinations of different crosslinked semiconductor and polyethylene insulating materials, are considered. The test objects consist of plaques with extruded semiconductor and cable models, having inner and outer semiconductor.
Keywords :
XLPE insulation; cable insulation; cables (electric); electron traps; hole traps; semiconductor-insulator boundaries; semiconductors; space charge; XLPE; cable models; charge trapping properties; crosslinked semiconducting-polyethylene insulating materials; extruded semiconductor; plaques; polymeric insulation/semiconducting interfaces; semiconducting materials; space charge; Cables; Charge measurement; Current measurement; Dielectrics and electrical insulation; Performance evaluation; Polymers; Pulse measurements; Semiconductor materials; Space charge; Testing;
Conference_Titel :
Electrical Insulating Materials, 2005. (ISEIM 2005). Proceedings of 2005 International Symposium on
Print_ISBN :
4-88686-063-X
DOI :
10.1109/ISEIM.2005.193338
