Title :
Microscopic Real-Space Resistance Mapping Across CdTe Solar Cell Junctions by Scanning Spreading Resistance Microscopy
Author :
Huan Li ; Chun-Sheng Jiang ; Metzger, Wyatt K. ; Chih-Kang Shih ; Al-Jassim, Mowafak
Author_Institution :
Nat. Renewable Energy Lab., Golden, CO, USA
Abstract :
We report on scanning spreading resistance microscopy on cross sections of thin-film CdTe devices. The results show the capability of identifying the multiple layers, the depletion region, and the nonuniform doping. We observe carrier injection and depletion region movement by laser illumination or by electrically biasing the device, directly revealing the underlying physics of the solar cell junction in real space with resolutions of nanometer scale.
Keywords :
II-VI semiconductors; electrical resistivity; semiconductor doping; semiconductor thin films; solar cells; CdTe; depletion region; electric biasing; laser illumination; microscopic real-space resistance mapping; nonuniform doping; scanning spreading resistance microscopy; solar cell junctions; thin-film devices; Electrical resistance measurement; Force; Junctions; Photovoltaic cells; Probes; Resistance; Semiconductor lasers; CdTe; Thin-film PV; microelectrical property; scanning spreading resistance microscopy (SRRM); solar cell junction;
Journal_Title :
Photovoltaics, IEEE Journal of
DOI :
10.1109/JPHOTOV.2014.2363569
