DocumentCode
170998
Title
Frequency scalable large signal transistor behavioral model based on admittance domain formulation
Author
Koh, M. ; Bell, J.J. ; Williams, Doug ; Patterson, A. ; Lees, J. ; Root, David E. ; Tasker, P.J.
Author_Institution
Sch. of Eng., Cardiff Univ., Cardiff, UK
fYear
2014
fDate
1-6 June 2014
Firstpage
1
Lastpage
3
Abstract
This paper introduces the first formulation and approach that enables measurement based non-linear behavioral look-up table transistor models to be frequency scalable. The experimental results on a M/A-COM GaN HFET from 2 GHz to 8 GHz, support theoretical analysis that frequency domain behavioral models defined in the admittance domain have frequency scalable model coefficients. Load-pull results indicate that the model can accurately predict non-linear behavior at frequencies where the large signal measurements were not performed.
Keywords
III-V semiconductors; UHF transistors; high electron mobility transistors; microwave transistors; semiconductor device measurement; semiconductor device models; table lookup; wide band gap semiconductors; GaN; M/A-COM HFET; admittance domain formulation; frequency 2 GHz to 8 GHz; frequency scalable large signal transistor behavioral model; nonlinear behavioral look-up table transistor models; Frequency measurement; Gallium nitride; HEMTs; Integrated circuits; MODFETs; RNA; MMIC design; Non-linear modeling; behavioral modeling; frequency scaling;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium (IMS), 2014 IEEE MTT-S International
Conference_Location
Tampa, FL
Type
conf
DOI
10.1109/MWSYM.2014.6848287
Filename
6848287
Link To Document