Title :
Frequency scalable large signal transistor behavioral model based on admittance domain formulation
Author :
Koh, M. ; Bell, J.J. ; Williams, Doug ; Patterson, A. ; Lees, J. ; Root, David E. ; Tasker, P.J.
Author_Institution :
Sch. of Eng., Cardiff Univ., Cardiff, UK
Abstract :
This paper introduces the first formulation and approach that enables measurement based non-linear behavioral look-up table transistor models to be frequency scalable. The experimental results on a M/A-COM GaN HFET from 2 GHz to 8 GHz, support theoretical analysis that frequency domain behavioral models defined in the admittance domain have frequency scalable model coefficients. Load-pull results indicate that the model can accurately predict non-linear behavior at frequencies where the large signal measurements were not performed.
Keywords :
III-V semiconductors; UHF transistors; high electron mobility transistors; microwave transistors; semiconductor device measurement; semiconductor device models; table lookup; wide band gap semiconductors; GaN; M/A-COM HFET; admittance domain formulation; frequency 2 GHz to 8 GHz; frequency scalable large signal transistor behavioral model; nonlinear behavioral look-up table transistor models; Frequency measurement; Gallium nitride; HEMTs; Integrated circuits; MODFETs; RNA; MMIC design; Non-linear modeling; behavioral modeling; frequency scaling;
Conference_Titel :
Microwave Symposium (IMS), 2014 IEEE MTT-S International
Conference_Location :
Tampa, FL
DOI :
10.1109/MWSYM.2014.6848287