Title :
Interfaces in polymer electronics
Author :
Taylor, D.M. ; Torres, I. ; Morris, D. ; Itoh, E.
Author_Institution :
Sch. of Informatics, Univ. of Wales, Bangor, UK
Abstract :
Studies of electrode/polymer and insulator-semiconductor interfaces are reported using respectively a time-resolved Scanning Kelvin Probe technique and admittance spectroscopy. The former provides evidence for ion migration to electrodes while the latter identifies the presence of interface states in metal-insulator-semiconductor devices.
Keywords :
MISFET; conducting polymers; electric admittance; electrodes; interface states; ionic conductivity; organic semiconductors; scanning probe microscopy; semiconductor-insulator boundaries; semiconductor-metal boundaries; admittance spectroscopy; electrode/polymer interface; insulator-semiconductor interface; interface states; ion migration; metal-insulator-semiconductor devices; polymer electronics; time-resolved scanning Kelvin probe technique; Admittance; Dielectrics and electrical insulation; Electrodes; Interface states; Kelvin; MISFETs; Organic light emitting diodes; Plastic insulation; Polymers; Probes;
Conference_Titel :
Electrical Insulating Materials, 2005. (ISEIM 2005). Proceedings of 2005 International Symposium on
Conference_Location :
Kitakyushu
Print_ISBN :
4-88686-063-X
DOI :
10.1109/ISEIM.2005.193371
