• DocumentCode
    1710433
  • Title

    Dielectric characteristics of ultra-pure SP adulterated with PANI

  • Author

    Dong, Xiaobing ; Xu, Chuanxiang ; Jiang, Xiuchen

  • Author_Institution
    Dept. of Electr. Eng., Shanghai Jiao Tong Univ., China
  • Volume
    1
  • fYear
    2005
  • Firstpage
    214
  • Abstract
    Restraining the impurity ions´ conductance under high temperature and preventing movement and accumulating of the ions under high field are concerned much in power silicon devices´ surface passivation. More attention should be paid to the high temperature conductance characteristic of silicone resin modified polyester (SP), which is used in power silicon device´s surface protection. The resistivity-temperature characteristic of PANI/SP composite, showing a positive resistivity-temperature characteristic or ´Platform effect´ in some temperature region, differs significantly from that of pure SP. The temperature threshold from electron conductance to ion conductance increases from 343 K to 383 K, which has different conductance mechanism. Permitivity and dielectric loss (tanδ) have little difference between SP and PANI-SP composite with certain ratio. Fourier transform infrared spectroscopy (FTlR) shows that the same solidification procedure for PANI/SP composite can be used as that for SP.
  • Keywords
    Fourier transform spectra; composite insulating materials; conducting polymers; dielectric losses; dielectric thin films; electrical conductivity transitions; electrical resistivity; impurities; infrared spectra; organic semiconductors; passivation; permittivity; polymer films; resins; solidification; surface treatment; 343 to 383 K; FTlR; Fourier transform infrared spectroscopy; PANI; dielectric characteristics; dielectric loss; electron conductance; impurity ion conductance; permittivity; power silicon devices; resistivity-temperature characteristic; solidification; surface passivation; surface protection; temperature threshold; ultra-pure SP; ultra-pure silicone resin modified polyester; Dielectric losses; Electrons; Fourier transforms; Impurities; Infrared spectra; Passivation; Protection; Resins; Silicon devices; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulating Materials, 2005. (ISEIM 2005). Proceedings of 2005 International Symposium on
  • Conference_Location
    Kitakyushu
  • Print_ISBN
    4-88686-063-X
  • Type

    conf

  • DOI
    10.1109/ISEIM.2005.193378
  • Filename
    1496100