DocumentCode

1711180

Title

Testing technique for early evaluation of compression land grid array connectors

Author

Brodsky, Wm L.

Author_Institution

IBM Corporation

fYear

2003

Firstpage

36

Lastpage

40

Keywords

Connectors; Contact resistance; Costs; Electric resistance; Force measurement; Hardware; Packaging; Reliability; Stress; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronic Components and Technology Conference, 2003. Proceedings. 53rd

ISSN

0569-5503

Print_ISBN

0-7803-7791-5

Type

conf

DOI

10.1109/ECTC.2003.1216253

Filename

1216253